Jörg E. Vollrath, Ulf Lederer, Thomas Hladschik. Compressed Bit Fail Maps for Memory Fail Pattern Classification. J. Electronic Testing, 17(3-4):291-297, 2001. [doi]
@article{VollrathLH01,
title = {Compressed Bit Fail Maps for Memory Fail Pattern Classification},
author = {Jörg E. Vollrath and Ulf Lederer and Thomas Hladschik},
year = {2001},
doi = {10.1023/A:1012271530348},
url = {http://dx.doi.org/10.1023/A:1012271530348},
tags = {classification, e-science},
researchr = {https://researchr.org/publication/VollrathLH01},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {17},
number = {3-4},
pages = {291-297},
}