A Silicon Testing Strategy for Pulse-Width Failures - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Srinivas Vooka, Khushboo Agarwal, Abhijeet Shrivastava, Pranav Murthy, Ramakrishnan Venkatraman. A Silicon Testing Strategy for Pulse-Width Failures. In Vishwani D. Agrawal, Srimat T. Chakradhar, editors, 25th International Conference on VLSI Design, VLSID 2012, Hyderabad, India, January 7-11, 2012. pages 352-357, IEEE, 2012. [doi]

This author has not been identified. Look up 'Srinivas Vooka' in GoogleThis author has not been identified. Look up 'Khushboo Agarwal' in GoogleThis author has not been identified. Look up 'Abhijeet Shrivastava' in GoogleThis author has not been identified. Look up 'Pranav Murthy' in GoogleThis author has not been identified. Look up 'Ramakrishnan Venkatraman' in Google

runs on WebDSL