Srinivas Vooka, Khushboo Agarwal, Abhijeet Shrivastava, Pranav Murthy, Ramakrishnan Venkatraman. A Silicon Testing Strategy for Pulse-Width Failures. In Vishwani D. Agrawal, Srimat T. Chakradhar, editors, 25th International Conference on VLSI Design, VLSID 2012, Hyderabad, India, January 7-11, 2012. pages 352-357, IEEE, 2012. [doi]
Abstract is missing.