A Signature Test Framework for Rapid Production Testing of RF Circuits - researchr publication authors

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Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee. A Signature Test Framework for Rapid Production Testing of RF Circuits. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 186-191, IEEE Computer Society, 2002. [doi]

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