Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee. A Signature Test Framework for Rapid Production Testing of RF Circuits. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 186-191, IEEE Computer Society, 2002. [doi]
@inproceedings{VoorakaranamCC02,
title = {A Signature Test Framework for Rapid Production Testing of RF Circuits},
author = {Ramakrishna Voorakaranam and Sasikumar Cherubal and Abhijit Chatterjee},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/date/2002/1471/00/14710186abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/VoorakaranamCC02},
cites = {0},
citedby = {0},
pages = {186-191},
booktitle = {2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-1471-5},
}