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Test Set Embedding into Low-Power BIST Sequences Using Maximum Bipartite Matching

Ioannis Voyiatzis, K. Axiotis, N. Papaspyrou, H. Antonopoulou, Costas Efstathiou. Test Set Embedding into Low-Power BIST Sequences Using Maximum Bipartite Matching. In 16th Panhellenic Conference on Informatics, PCI 2012, Piraeus, Greece, October 5-7, 2012. pages 74-79, IEEE Computer Society, 2012. [doi]

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Ioannis Voyiatzis

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K. Axiotis

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N. Papaspyrou

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H. Antonopoulou

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Costas Efstathiou

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