Test Set Embedding into Low-Power BIST Sequences Using Maximum Bipartite Matching - researchr publication related

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Ioannis Voyiatzis, K. Axiotis, N. Papaspyrou, H. Antonopoulou, Costas Efstathiou. Test Set Embedding into Low-Power BIST Sequences Using Maximum Bipartite Matching. In 16th Panhellenic Conference on Informatics, PCI 2012, Piraeus, Greece, October 5-7, 2012. pages 74-79, IEEE Computer Society, 2012. [doi]

The following publications are possibly variants of this publication:

Embedding test patterns into Low-Power BIST sequencesIoannis Voyiatzis. iolts 2007: 197-198 [doi]

On Embedding Test Patterns into Low-Power Bist SequencesIoannis Voyiatzis. jcis, 49(2):58-64, 2008. [doi]

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