Ioannis Voyiatzis, K. Axiotis, N. Papaspyrou, H. Antonopoulou, Costas Efstathiou. Test Set Embedding into Low-Power BIST Sequences Using Maximum Bipartite Matching. In 16th Panhellenic Conference on Informatics, PCI 2012, Piraeus, Greece, October 5-7, 2012. pages 74-79, IEEE Computer Society, 2012. [doi]
@inproceedings{VoyiatzisAPAE12,
title = {Test Set Embedding into Low-Power BIST Sequences Using Maximum Bipartite Matching},
author = {Ioannis Voyiatzis and K. Axiotis and N. Papaspyrou and H. Antonopoulou and Costas Efstathiou},
year = {2012},
doi = {10.1109/PCi.2012.75},
url = {http://doi.ieeecomputersociety.org/10.1109/PCi.2012.75},
researchr = {https://researchr.org/publication/VoyiatzisAPAE12},
cites = {0},
citedby = {0},
pages = {74-79},
booktitle = {16th Panhellenic Conference on Informatics, PCI 2012, Piraeus, Greece, October 5-7, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-2720-6},
}