Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis. An Input Vector Monitoring Concurrent BIST scheme exploiting . In 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal. pages 206-207, IEEE, 2009. [doi]
@inproceedings{VoyiatzisGP09,
title = {An Input Vector Monitoring Concurrent BIST scheme exploiting },
author = {Ioannis Voyiatzis and Dimitris Gizopoulos and Antonis M. Paschalis},
year = {2009},
doi = {10.1109/IOLTS.2009.5196015},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2009.5196015},
researchr = {https://researchr.org/publication/VoyiatzisGP09},
cites = {0},
citedby = {0},
pages = {206-207},
booktitle = {15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal},
publisher = {IEEE},
isbn = {978-1-4244-4596-7},
}