Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier. Enhanced reduced pin-count test for full-scan design. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 738-747, IEEE Computer Society, 2001.
@inproceedings{VrankenWFL01,
title = {Enhanced reduced pin-count test for full-scan design},
author = {Harald P. E. Vranken and Tom Waayers and Hérvé Fleury and David Lelouvier},
year = {2001},
tags = {design science, testing, e-science, design},
researchr = {https://researchr.org/publication/VrankenWFL01},
cites = {0},
citedby = {0},
pages = {738-747},
booktitle = {Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001},
publisher = {IEEE Computer Society},
isbn = {0-7803-7169-0},
}