Enhanced reduced pin-count test for full-scan design - researchr publication

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Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier. Enhanced reduced pin-count test for full-scan design. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 738-747, IEEE Computer Society, 2001.

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