Generating Efficient Tests for Continuous Scan

Sying-Jyan Wang, Sheng-Nan Chiou. Generating Efficient Tests for Continuous Scan. In Proceedings of the 38th Design Automation Conference, DAC 2001, Las Vegas, NV, USA, June 18-22, 2001. pages 162-165, ACM, 2001. [doi]

Authors

Sying-Jyan Wang

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Sheng-Nan Chiou

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