Generating Efficient Tests for Continuous Scan

Sying-Jyan Wang, Sheng-Nan Chiou. Generating Efficient Tests for Continuous Scan. In Proceedings of the 38th Design Automation Conference, DAC 2001, Las Vegas, NV, USA, June 18-22, 2001. pages 162-165, ACM, 2001. [doi]

Abstract

Abstract is missing.