Sying-Jyan Wang, Sheng-Nan Chiou. Generating Efficient Tests for Continuous Scan. In Proceedings of the 38th Design Automation Conference, DAC 2001, Las Vegas, NV, USA, June 18-22, 2001. pages 162-165, ACM, 2001. [doi]
@inproceedings{WangC01:7,
title = {Generating Efficient Tests for Continuous Scan},
author = {Sying-Jyan Wang and Sheng-Nan Chiou},
year = {2001},
url = {http://jamaica.ee.pitt.edu/Archives/ProceedingArchives/Dac/Dac2001/papers/2001/dac01/pdffiles/10_4.pdf},
tags = {testing},
researchr = {https://researchr.org/publication/WangC01%3A7},
cites = {0},
citedby = {0},
pages = {162-165},
booktitle = {Proceedings of the 38th Design Automation Conference, DAC 2001, Las Vegas, NV, USA, June 18-22, 2001},
publisher = {ACM},
isbn = {1-58113-297-2},
}