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Zhanglei Wang, Krishnendu Chakrabarty. Built-in self-test of molecular electronics-based nanofabrics. In 10th European Test Symposium (ETS 2005), May 22-25, 2005, Tallinn, Estonia. pages 168-173, IEEE, 2005. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Built-in Self-test and Defect Tolerance in Molecular Electronics-based NanofabricsZhanglei Wang, Krishnendu Chakrabarty. et, 23(2-3):145-161, 2007. [doi] Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabricsZhanglei Wang, Krishnendu Chakrabarty. itc 2005: 10 [doi]
The following publications are possibly variants of this publication: