Seongmoon Wang, Srimat T. Chakradhar. A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(8):1555-1564, 2006. [doi]
@article{WangC06:5,
title = {A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs},
author = {Seongmoon Wang and Srimat T. Chakradhar},
year = {2006},
doi = {10.1109/TCAD.2005.855929},
url = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2005.855929},
tags = {test coverage, testing, coverage},
researchr = {https://researchr.org/publication/WangC06%3A5},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {25},
number = {8},
pages = {1555-1564},
}