A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs - researchr publication references

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Seongmoon Wang, Srimat T. Chakradhar. A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(8):1555-1564, 2006. [doi]

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