The following publications are possibly variants of this publication:
- A Scalable Scan-Path Test Point Insertion Technique to Enhance Delay Fault Coverage for Standard Scan DesignsSeongmoon Wang, Srimat T. Chakradhar. itc 2003: 574-583 [doi]
- Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test PatternsSeongmoon Wang, Wenlong Wei. ets 2008: 125-130 [doi]
- Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test SetsSeongmoon Wang, Xiao Liu, Srimat T. Chakradhar. date 2004: 1296-1301 [doi]
- On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan DesignsShianling Wu, Laung-Terng Wang, Zhigang Jiang, Jiayong Song, Boryau Sheu, Xiaoqing Wen, Michael Hsiao, James Chien-Mo Li, Jiun-Lang Huang, Ravi Apte. dft 2008: 143-151 [doi]
- Distance Restricted Scan Chain Reordering to Enhance Delay Fault CoverageWei Li, Seongmoon Wang, Srimat T. Chakradhar, Sudhakar M. Reddy. vlsid 2005: 471-478 [doi]