Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters - researchr publication authors

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Xian Wang, Hyun Woo Choi, Thomas Moon, Nicholas Tzou, Abhijit Chatterjee. Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-10, IEEE Computer Society, 2012. [doi]

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