Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters

Xian Wang, Hyun Woo Choi, Thomas Moon, Nicholas Tzou, Abhijit Chatterjee. Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-10, IEEE Computer Society, 2012. [doi]

@inproceedings{WangCMTC12,
  title = {Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters},
  author = {Xian Wang and Hyun Woo Choi and Thomas Moon and Nicholas Tzou and Abhijit Chatterjee},
  year = {2012},
  doi = {10.1109/TEST.2012.6401538},
  url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2012.6401538},
  researchr = {https://researchr.org/publication/WangCMTC12},
  cites = {0},
  citedby = {0},
  pages = {1-10},
  booktitle = {2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012},
  publisher = {IEEE Computer Society},
  isbn = {978-1-4673-1594-4},
}