Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Seongmoon Wang, Sandeep K. Gupta. An automatic test pattern generator for minimizing switching activity during scan testing activity. IEEE Trans. on CAD of Integrated Circuits and Systems, 21(8):954-968, 2002. [doi]