Seongmoon Wang, Sandeep K. Gupta. An automatic test pattern generator for minimizing switching activity during scan testing activity. IEEE Trans. on CAD of Integrated Circuits and Systems, 21(8):954-968, 2002. [doi]
@article{WangG02a,
title = {An automatic test pattern generator for minimizing switching activity during scan testing activity},
author = {Seongmoon Wang and Sandeep K. Gupta},
year = {2002},
doi = {10.1109/TCAD.2002.800460},
url = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2002.800460},
tags = {testing},
researchr = {https://researchr.org/publication/WangG02a},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {21},
number = {8},
pages = {954-968},
}