A New Approach to Derive Robust Sets for Stuck-open Faults in CMOS Combinational Logic Circuits - researchr publication authors

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J. F. Wang, T. Y. Kuo, J. Y. Lee. A New Approach to Derive Robust Sets for Stuck-open Faults in CMOS Combinational Logic Circuits. In DAC. pages 726-729, 1989. [doi]

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