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J. F. Wang, T. Y. Kuo, J. Y. Lee. A New Approach to Derive Robust Sets for Stuck-open Faults in CMOS Combinational Logic Circuits. In DAC. pages 726-729, 1989. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Test Generation of Stuck-open Faults Using Stuck-at Test Sets in CMOS Combinational CircuitsHyung Ki Lee, Dong Sam Ha, K. Kim. dac 1989: 345-350 [doi] SOPRANO: An Efficient Automatic Test Pattern Generator for Stuck-Open Faults in CMOS Combinational CircuitsHyung Ki Lee, Dong Sam Ha. dac 1990: 660-666 [doi]
The following publications are possibly variants of this publication: