Test for more than pass/fail using on-chip temperature sensor - researchr publication authors

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Chih-Wea Wang, Chen-Tung Lin, Chun-Chieh Hsu, Ching-Tung Wu, Chi-Feng Wu. Test for more than pass/fail using on-chip temperature sensor. In Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, VLSI-DAT 2012, Hsinchu, Taiwan, April 23-25, 2012. pages 1-4, IEEE, 2012. [doi]

This author has not been identified. Look up 'Chih-Wea Wang' in GoogleThis author has not been identified. Look up 'Chen-Tung Lin' in GoogleThis author has not been identified. Look up 'Chun-Chieh Hsu' in GoogleThis author has not been identified. Look up 'Ching-Tung Wu' in GoogleThis author has not been identified. Look up 'Chi-Feng Wu' in Google

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