Chih-Wea Wang, Chen-Tung Lin, Chun-Chieh Hsu, Ching-Tung Wu, Chi-Feng Wu. Test for more than pass/fail using on-chip temperature sensor. In Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, VLSI-DAT 2012, Hsinchu, Taiwan, April 23-25, 2012. pages 1-4, IEEE, 2012. [doi]
@inproceedings{WangLHWW12,
title = {Test for more than pass/fail using on-chip temperature sensor},
author = {Chih-Wea Wang and Chen-Tung Lin and Chun-Chieh Hsu and Ching-Tung Wu and Chi-Feng Wu},
year = {2012},
doi = {10.1109/VLSI-DAT.2012.6212639},
url = {http://dx.doi.org/10.1109/VLSI-DAT.2012.6212639},
researchr = {https://researchr.org/publication/WangLHWW12},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, VLSI-DAT 2012, Hsinchu, Taiwan, April 23-25, 2012},
publisher = {IEEE},
isbn = {978-1-4577-2080-2},
}