Power-Rail ESD Clamp Circuit with Parasitic-BJT and Channel Parallel Shunt Paths to Achieve Enhanced Robustness

Yuan Wang, Guangyi Lu, Yize Wang, Xing Zhang. Power-Rail ESD Clamp Circuit with Parasitic-BJT and Channel Parallel Shunt Paths to Achieve Enhanced Robustness. IEICE Transactions, 100-C(3):344-347, 2017. [doi]

Authors

Yuan Wang

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Guangyi Lu

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Yize Wang

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Xing Zhang

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