Power-Rail ESD Clamp Circuit with Parasitic-BJT and Channel Parallel Shunt Paths to Achieve Enhanced Robustness

Yuan Wang, Guangyi Lu, Yize Wang, Xing Zhang. Power-Rail ESD Clamp Circuit with Parasitic-BJT and Channel Parallel Shunt Paths to Achieve Enhanced Robustness. IEICE Transactions, 100-C(3):344-347, 2017. [doi]

Abstract

Abstract is missing.