Naixing Wang, Irith Pomeranz, Brady Benware, M. EnamulAmyeen, Srikanth Venkataraman. Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests. In 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018. pages 1-6, IEEE Computer Society, 2018. [doi]
Abstract is missing.