Power Supply Noise in Delay Testing - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Jing Wang 0006, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger. Power Supply Noise in Delay Testing. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]

This author has not been identified. Look up 'Jing Wang 0006' in GoogleThis author has not been identified. Look up 'D. M. H. Walker' in GoogleThis author has not been identified. Look up 'Ananta K. Majhi' in GoogleThis author has not been identified. Look up 'Bram Kruseman' in GoogleThis author has not been identified. Look up 'Guido Gronthoud' in GoogleThis author has not been identified. Look up 'Luis Elvira Villagra' in GoogleThis author has not been identified. Look up 'Paul van de Wiel' in GoogleThis author has not been identified. Look up 'Stefan Eichenberger' in Google

runs on WebDSL