The following publications are possibly variants of this publication:
- Static Compaction of Delay Tests Considering Power Supply NoiseJing Wang, Xiang Lu, Wangqi Qiu, Ziding Yue, Steve Fancler, Weiping Shi, D. M. H. Walker. vts 2005: 235-240 [doi]
- Modeling Power Supply Noise in Delay TestingJing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger. dt, 24(3):226-234, 2007. [doi]
- Levelized low cost delay test compaction considering IR-drop induced power supply noiseZhongwei Jiang, Zheng Wang, Jing Wang 0006, D. M. H. Walker. vts 2011: 52-57 [doi]
- Power Supply Ramping for Quasi-static Testing of PLLsJosé Pineda de Gyvez, Guido Gronthoud, Cristiano Cenci, Martin Posch, Thomas Burger, Manfred Koller. itc 2003: 980-987 [doi]