Radiation Tolerant SRAM Cell Design in 65nm Technology - researchr publication authors

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Jianan Wang, Xue Wu, Haonan Tian, Lixiang Li 0003, Shuting Shi, Li Chen 0001. Radiation Tolerant SRAM Cell Design in 65nm Technology. J. Electronic Testing, 37(2):255-262, 2021. [doi]

This author has not been identified. Look up 'Jianan Wang' in GoogleThis author has not been identified. Look up 'Xue Wu' in GoogleThis author has not been identified. Look up 'Haonan Tian' in GoogleThis author has not been identified. Look up 'Lixiang Li 0003' in GoogleThis author has not been identified. Look up 'Shuting Shi' in GoogleThis author has not been identified. Look up 'Li Chen 0001' in Google

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