Jianan Wang, Xue Wu, Haonan Tian, Lixiang Li 0003, Shuting Shi, Li Chen 0001. Radiation Tolerant SRAM Cell Design in 65nm Technology. J. Electronic Testing, 37(2):255-262, 2021. [doi]
@article{WangWTLSC21,
title = {Radiation Tolerant SRAM Cell Design in 65nm Technology},
author = {Jianan Wang and Xue Wu and Haonan Tian and Lixiang Li 0003 and Shuting Shi and Li Chen 0001},
year = {2021},
doi = {10.1007/s10836-021-05941-5},
url = {https://doi.org/10.1007/s10836-021-05941-5},
researchr = {https://researchr.org/publication/WangWTLSC21},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {37},
number = {2},
pages = {255-262},
}