Radiation Tolerant SRAM Cell Design in 65nm Technology

Jianan Wang, Xue Wu, Haonan Tian, Lixiang Li 0003, Shuting Shi, Li Chen 0001. Radiation Tolerant SRAM Cell Design in 65nm Technology. J. Electronic Testing, 37(2):255-262, 2021. [doi]

Abstract

Abstract is missing.