Functional Broadside Test Generation Using a Commercial ATPG Tool - researchr publication authors

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Naixing Wang, Bo Yao, Xijiang Lin, Irith Pomeranz. Functional Broadside Test Generation Using a Commercial ATPG Tool. In 2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017. pages 308-313, IEEE, 2017. [doi]

This author has not been identified. Look up 'Naixing Wang' in GoogleThis author has not been identified. Look up 'Bo Yao' in GoogleThis author has not been identified. Look up 'Xijiang Lin' in GoogleThis author has not been identified. Look up 'Irith Pomeranz' in Google

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