Modeling and physical mechanism analysis of the effect of a polycrystalline-ferroelectric gate on FE-FinFETs

Chengxu Wang, Hao Yu, Yichen Wang, Zichong Zhang, Xiangshui Miao, Xingsheng Wang. Modeling and physical mechanism analysis of the effect of a polycrystalline-ferroelectric gate on FE-FinFETs. Science in China Series F: Information Sciences, 66(5), May 2023. [doi]

Abstract

Abstract is missing.