Drain current model for double-gate tunnel field-effect transistor with hetero-gate-dielectric and source-pocket

Ping Wang, Yiqi Zhuang, Cong Li, Zhi Jiang, Yuqi Liu. Drain current model for double-gate tunnel field-effect transistor with hetero-gate-dielectric and source-pocket. Microelectronics Reliability, 59:30-36, 2016. [doi]

Authors

Ping Wang

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Yiqi Zhuang

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Cong Li

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Zhi Jiang

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Yuqi Liu

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