Drain current model for double-gate tunnel field-effect transistor with hetero-gate-dielectric and source-pocket

Ping Wang, Yiqi Zhuang, Cong Li, Zhi Jiang, Yuqi Liu. Drain current model for double-gate tunnel field-effect transistor with hetero-gate-dielectric and source-pocket. Microelectronics Reliability, 59:30-36, 2016. [doi]

Abstract

Abstract is missing.