Ping Wang, Yiqi Zhuang, Cong Li, Zhi Jiang, Yuqi Liu. Drain current model for double-gate tunnel field-effect transistor with hetero-gate-dielectric and source-pocket. Microelectronics Reliability, 59:30-36, 2016. [doi]
@article{WangZLJL16,
title = {Drain current model for double-gate tunnel field-effect transistor with hetero-gate-dielectric and source-pocket},
author = {Ping Wang and Yiqi Zhuang and Cong Li and Zhi Jiang and Yuqi Liu},
year = {2016},
doi = {10.1016/j.microrel.2015.09.014},
url = {http://dx.doi.org/10.1016/j.microrel.2015.09.014},
researchr = {https://researchr.org/publication/WangZLJL16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {59},
pages = {30-36},
}