A fast sweep-line-based failure pattern extractor for memory diagnosis

Sin-Yu Wei, Bing-Yang Lin, Cheng-Wen Wu. A fast sweep-line-based failure pattern extractor for memory diagnosis. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016. pages 1-6, IEEE, 2016. [doi]

Authors

Sin-Yu Wei

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Bing-Yang Lin

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Cheng-Wen Wu

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