Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Sin-Yu Wei, Bing-Yang Lin, Cheng-Wen Wu. A fast sweep-line-based failure pattern extractor for memory diagnosis. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016. pages 1-6, IEEE, 2016. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: MicroHash: An Efficient Index Structure for Flash-Based Sensor DevicesDemetrios Zeinalipour-Yazti, Song Lin, Vana Kalogeraki, Dimitrios Gunopulos, Walid A. Najjar. FAST 2005: [doi] A Memory Failure Pattern Analyzer for memory diagnosis and repairBing-Yang Lin, Mincent Lee, Cheng-Wen Wu. vts 2012: 234-239 [doi]
The following publications are possibly variants of this publication: