Sin-Yu Wei, Bing-Yang Lin, Cheng-Wen Wu. A fast sweep-line-based failure pattern extractor for memory diagnosis. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016. pages 1-6, IEEE, 2016. [doi]
@inproceedings{WeiLW16-1,
title = {A fast sweep-line-based failure pattern extractor for memory diagnosis},
author = {Sin-Yu Wei and Bing-Yang Lin and Cheng-Wen Wu},
year = {2016},
doi = {10.1109/ETS.2016.7519314},
url = {http://dx.doi.org/10.1109/ETS.2016.7519314},
researchr = {https://researchr.org/publication/WeiLW16-1},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016},
publisher = {IEEE},
isbn = {978-1-4673-9659-2},
}