Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor. Power-aware test generation with guaranteed launch safety for at-speed scan testing. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 166-171, IEEE Computer Society, 2011. [doi]
Abstract is missing.