Simulation study of lateral CEFT logic performance at 3 nm Node - researchr publication authors

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Guanguo Wen, Qiang Long, Xinlong Shi, Ying Wang, Feng Liu, Huiyong Hu, JinCheng Zhang. Simulation study of lateral CEFT logic performance at 3 nm Node. Microelectronics Journal, 139:105865, September 2023. [doi]

This author has not been identified. Look up 'Guanguo Wen' in GoogleThis author has not been identified. Look up 'Qiang Long' in GoogleThis author has not been identified. Look up 'Xinlong Shi' in GoogleThis author has not been identified. Look up 'Ying Wang' in GoogleThis author has not been identified. Look up 'Feng Liu' in GoogleThis author has not been identified. Look up 'Huiyong Hu' in GoogleThis author has not been identified. Look up 'JinCheng Zhang' in Google

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