Guanguo Wen, Qiang Long, Xinlong Shi, Ying Wang, Feng Liu, Huiyong Hu, JinCheng Zhang. Simulation study of lateral CEFT logic performance at 3 nm Node. Microelectronics Journal, 139:105865, September 2023. [doi]
@article{WenLSWLHZ23,
title = {Simulation study of lateral CEFT logic performance at 3 nm Node},
author = {Guanguo Wen and Qiang Long and Xinlong Shi and Ying Wang and Feng Liu and Huiyong Hu and JinCheng Zhang},
year = {2023},
month = {September},
doi = {10.1016/j.mejo.2023.105865},
url = {https://doi.org/10.1016/j.mejo.2023.105865},
researchr = {https://researchr.org/publication/WenLSWLHZ23},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {139},
pages = {105865},
}