Reducing Scan Test Data Volume and Time: A Diagnosis Friendly Finite Memory Compactor

Sverre Wichlund, Einar J. Aas. Reducing Scan Test Data Volume and Time: A Diagnosis Friendly Finite Memory Compactor. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 421-430, IEEE, 2006. [doi]

Abstract

Abstract is missing.