Scan Test Response Compaction Combined with Diagnosis Capabilities

Sverre Wichlund, Frank Berntsen, Einar J. Aas. Scan Test Response Compaction Combined with Diagnosis Capabilities. J. Electronic Testing, 24(1-3):235-246, 2008. [doi]

Authors

Sverre Wichlund

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Frank Berntsen

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Einar J. Aas

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