Sverre Wichlund, Frank Berntsen, Einar J. Aas. Scan Test Response Compaction Combined with Diagnosis Capabilities. J. Electronic Testing, 24(1-3):235-246, 2008. [doi]
@article{WichlundBA08,
title = {Scan Test Response Compaction Combined with Diagnosis Capabilities},
author = {Sverre Wichlund and Frank Berntsen and Einar J. Aas},
year = {2008},
doi = {10.1007/s10836-007-5043-1},
url = {http://dx.doi.org/10.1007/s10836-007-5043-1},
tags = {testing},
researchr = {https://researchr.org/publication/WichlundBA08},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {24},
number = {1-3},
pages = {235-246},
}