A Built-in Test Circuit for Electrical Interconnect Testing of Open Defects in Assembled PCBs - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Widianto, Masaki Hashizume, Shohei Suenaga, Hiroyuki Yotsuyanagi, Akira Ono, Shyue-Kung Lu, Zvi Roth. A Built-in Test Circuit for Electrical Interconnect Testing of Open Defects in Assembled PCBs. IEICE Transactions, 99-D(11):2723-2733, 2016. [doi]

This author has not been identified. Look up 'Widianto' in GoogleThis author has not been identified. Look up 'Masaki Hashizume' in GoogleThis author has not been identified. Look up 'Shohei Suenaga' in GoogleThis author has not been identified. Look up 'Hiroyuki Yotsuyanagi' in GoogleThis author has not been identified. Look up 'Akira Ono' in GoogleThis author has not been identified. Look up 'Shyue-Kung Lu' in GoogleThis author has not been identified. Look up 'Zvi Roth' in Google

runs on WebDSL