Widianto, Masaki Hashizume, Shohei Suenaga, Hiroyuki Yotsuyanagi, Akira Ono, Shyue-Kung Lu, Zvi Roth. A Built-in Test Circuit for Electrical Interconnect Testing of Open Defects in Assembled PCBs. IEICE Transactions, 99-D(11):2723-2733, 2016. [doi]
@article{WidiantHSYOLR16,
title = {A Built-in Test Circuit for Electrical Interconnect Testing of Open Defects in Assembled PCBs},
author = {Widianto and Masaki Hashizume and Shohei Suenaga and Hiroyuki Yotsuyanagi and Akira Ono and Shyue-Kung Lu and Zvi Roth},
year = {2016},
url = {http://search.ieice.org/bin/summary.php?id=e99-d_11_2723},
researchr = {https://researchr.org/publication/WidiantHSYOLR16},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {99-D},
number = {11},
pages = {2723-2733},
}